*
Corresponding authors
a
Nationwide Metrology Institute of Japan (NMIJ), Nationwide Institute of Superior Industrial Science and Expertise (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Japan
b
Optical Sciences Centre and ARC Coaching Centre in Floor Engineering for Superior Supplies (SEAM), Faculty of Science, Swinburne College of Expertise, Hawthorn, Victoria 3122, Australia
c
Institute of Physics, College of Tartu, Tartu, Estonia
d
Infrared Microspectroscopy (IRM) Beamline, ANSTO-Australian Synchrotron, 800 Blackburn Street, Clayton, Victoria 3168, Australia
e
THz/Far-Infrared Beamline, ANSTO-Australian Synchrotron, 800 Blackburn Street, Clayton, Victoria 3168, Australia
f
Division of Electrical and Laptop Engineering, Graduate Faculty of Engineering, Yokohama Nationwide College, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, Japan
g
WRH Program, Worldwide Analysis Frontiers Initiative (IRFI) Tokyo Institute of Expertise, Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan
h
CREST – JST and Faculty of Supplies and Chemical Expertise, Tokyo Institute of Expertise, Ookayama, Meguro-ku, Tokyo 152-8550, Japan
E-mail:
morikawa.j.aa@m.titech.ac.jp
