Oxford Devices Asylum Analysis at present declares the discharge of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) excessive voltage accent for the Jupiter XR atomic drive microscope (AFM). The NanoTDDB method measures the voltage at which a cloth undergoes dielectric breakdown. This distinctive nanoTDDB accent expands the vary {of electrical} characterization instruments obtainable on Jupiter XR, permitting for superior measurements within the fields of semiconductors, 2D supplies, skinny movies and polymers.
Picture Credit score: Asylum Analysis – An Oxford Devices Firm
“The nanoTDDB accent can measure breakdown voltages as much as ±150 V on each small and enormous samples, akin to 200 mm wafers. It’s a fantastic addition to the suite of equipment for the Jupiter XR AFM,” commented Dr. Jason Li, Product Science Group Supervisor at Oxford Devices Asylum Analysis.
Asylum Analysis AFMs are extensively used throughout many alternative industrial and educational analysis fields, together with vitality storage, polymers, semiconductors and 2D supplies. The Jupiter XR is a large-sample AFM that may accommodate samples as much as 200 millimeters in diameter and examine areas as much as 100×100 microns whereas nonetheless delivering ultra-high decision and excessive throughput, with typical photographs taking lower than 60 seconds to amass.
Supply: https://afm.oxinst.com/
