Oxford Devices Asylum Analysis at present pronounces the discharge of its new atomic power microscope (AFM) bundle developed for battery analysis, the Cypher ES Battery Version. The configuration combines the ultra-high-performance Cypher ES AFM with an easy-to-use electrochemistry cell that permits a variety of EC-AFM experiments. Efficiency options embrace quick scanning to allow seize of dynamic processes and unmatched stability and determination even when built-in with a glovebox for lithium battery analysis.
“The Cypher ES Battery Version is a flexible device for optimizing battery efficiency and enabling nanoscale characterization of the electrode/electrolyte interface. For instance, it may possibly monitor the formation and stability of solid-electrolyte interphases (SEI) or probe electrical double-layer (EDL) buildings,” commented Dr. Ben Ohler, Senior Product Line Supervisor at Oxford Devices Asylum Analysis.
Oxford Devices presents a full vary of complementary instruments for battery analysis, together with power dispersive X-ray spectroscopy (EDS), nuclear magnetic resonance (NMR), and Raman imaging applied sciences pioneered by WITec GmbH. Raman microscopes can non-destructively determine battery supplies and visualize their distribution, and correlative (Raman-SEM) devices combine chemical sensitivity with structural evaluation for extra complete pattern characterization.
Supply: https://afm.oxinst.com/