Oxford Devices Asylum Analysis declares the discharge of the HVA150 – excessive voltage accent for the Jupiter XR atomic power microscope (AFM). HVA150 expands the bias vary that can be utilized throughout AFM experiments as much as ±150 V, permitting for superior AFM characterization of piezoelectric & ferroelectrics supplies, 2D supplies and skinny movies. “The HVA150 is fast to set-up, secure and the outcomes are spectacular. It’s a welcome boost to the suite of equipment for the Jupiter XR AFM,” commented Dr. Jason Li, Purposes Scientist supervisor at Oxford Devices Asylum Analysis.
Asylum Analysis AFMs are broadly used throughout many alternative industrial and tutorial analysis fields together with vitality storage, polymers, semiconductors and 2D supplies. The Jupiter XR is a large-sample AFM that may accommodate samples as much as 200 millimeters in diameter and examine areas as much as 100×100 microns whereas nonetheless delivering ultra-high decision and excessive throughput, with typical photos requiring <1 minute to amass.
Supply: https://afm.oxinst.com/