Flakes of two-dimensional (2D) supplies have distinctive quantum qualities that aren’t seen in frequent supplies since they solely have one to a couple atomic layers. Consequently, these supplies have an incredible quantity of potential for each superior analysis and industrial functions.
TOC picture. Picture Credit score: Hebrew College of Jerusalem/ACS Publications
Up to now, ellipsometry has been a generally used optical methodology for noninvasive measurement of thin-film thicknesses. Business ellipsometers, however, have difficulties in terms of measuring areas which are smaller than 50–60 microns, whereas 2D flakes ceaselessly solely have lateral dimensions of some microns.
Spectroscopic Micro-Ellipsometer (SME), a system and methodology for a microscope-integrated ellipsometer, was created and patented by Prof. Ronen Rapaport and Ralfy Kenaz of Hebrew College in response to this substantial problem.
With this state-of-the-art instrument, thin-film thickness measurements in extremely small areas—down to only 2 microns large—will be made shortly and with atomic-level accuracy. The instrument’s excellent efficiency has already been confirmed in a special publication, enhancing its legitimacy and dependability.
Researchers from Hebrew College used this cutting-edge micro-ellipsometer to handle the present scientific problem of measuring and mapping the thicknesses of atomically skinny 2D materials flakes in a brand new examine printed within the journal ACS Nano.
The outcomes clearly present that the micro-ellipsometer can measure and map the thicknesses of varied 2D materials flakes, enabling the estimation of their atomic layer rely.
The outcomes of this examine have broad ramifications for quite a lot of microstructure-related corporations and analysis domains. They pave the best way for terribly exact optical research of microstructures, which is able to result in technological enhancements and new horizons in science.
This analysis delivers a recent and priceless system for each researchers and corporations by introducing the applying of the well-established and intensely delicate ellipsometry approach to microstructures.
There are quite a few attainable makes use of for the Spectroscopic Micro-Ellipsometer within the skinny movie business, together with high quality management of wafers, characterizing 2D units and nanoscale metamaterials, and inspecting the crystal construction of nanoparticles.
Prof. Hadar Steinberg’s lab, additionally from the Racah Institute of Physics at Hebrew College, specializing within the examine of 2D supplies, labored carefully with Prof. Ronen Rapaport’s lab from the Racah Institute of Physics, identified for his or her proficiency in optics investigations.
Journal Reference
Kenaz, R., et al. (2023) Thickness Mapping and Layer Quantity Identification of Exfoliated van der Waals Supplies by Fourier Imaging Micro-Ellipsometry. ACS Nano. doi:10.1021/acsnano.2c12773.
Supply: https://en.huji.ac.il/
