Oxford Devices Asylum Analysis declares the discharge of the HVA150 – excessive voltage accent for the Jupiter XR atomic power microscope (AFM). HVA150 expands the bias vary that can be utilized throughout AFM experiments as much as ±150 V, permitting for superior AFM characterization of piezoelectric & ferroelectrics supplies, 2D supplies and skinny movies. “The HVA150 is fast to set-up, secure and the outcomes are spectacular. It’s a welcome boost to the suite of equipment for the Jupiter XR AFM,” commented Dr. Jason Li, Purposes Scientist supervisor at Oxford Devices Asylum Analysis.
Picture Credit score: Asylum Analysis – An Oxford Devices Firm
Asylum Analysis AFMs are broadly used throughout many alternative industrial and tutorial analysis fields together with vitality storage, polymers, semiconductors and 2D supplies. The Jupiter XR is a large-sample AFM that may accommodate samples as much as 200 millimeters in diameter and examine areas as much as 100×100 microns whereas nonetheless delivering ultra-high decision and excessive throughput, with typical photos requiring <1 minute to amass.
Supply: https://afm.oxinst.com/
